Inspection probe compatible with ultra-fine pitch! 'MEMS Probe'
"Inspection probes compatible with ultra-fine pitch" Automatic production system from microfabrication to inspection.
The "MEMS Probe" is an ideal MEMS probe for semiconductor wafer testing, including microprocessors and application processors. This product achieves low resistance and low inductance through its unique structure. Additionally, our company manufactures probes with high precision and stable quality, handling everything from the processing of fine MEMS spring probes to inspection, so please feel free to contact us. 【Features】 ■ Unique structure ■ Optimal for semiconductor wafer testing ■ Supports ultra-fine pitch ■ Achieves low resistance and low inductance *For more details, please refer to the catalog or feel free to contact us.
- 企業：ニデックアドバンステクノロジー 本社、東京営業所、名古屋営業所
- 価格：Other
